software:maud
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MAUD: Materials Analysis Using Diffraction
Maud is an a Rietveld extended program to perform the combined analysis. It can be used to fit diffraction, fluorescence and reflectivity data using X-ray, neutron, TOF or electrons.
List of MAUD features, as copied from the MAUD homepage
- Written in Java can run on Windows, MacOSX, Linux, Unix (needs Java VM 1.7 or later)
- Easy to use, every action is controlled by a GUI
- Works with X-ray, synchrotron, Neutron, TOF and electrons
- Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported
- Ab-initio structure solution integration, from peak finding, indexing to solving
- Different optimization algorithms available (Least Squares, Evolutionary, Simulated Annealing, Metadynamics, Simplex, Lamarckian…)
- Le Bail fitting
- Quantitative phase analysis wizard
- Microstructure analysis (size-strain, anisotropy, planar defects, turbostratic disorder and distributions included)
- Texture and residual stress analysis using part or full spectra
- MEEM and superflip algorithm for Electron Density Maps and fitting
- Thin film and multilayer aware; film thickness and absorption models
- Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
- Fluorescence full pattern fitting based on crystal structure models (XRF and GIXRF full quantification)
- Works with TEM diffraction images and electron scattering
- Several datafile input formats
- Works with images from 2D detectors (image plates, CCDs, flat or curved), integration and calibration included
- CIF compliance for input/output; import structures from databases
- Many other features…look at the Maud in action page.
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